i10 Productivity
Rankings
ASML Holding/ ScientistsOthers i10 Productivity Rankings 2024
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Click for "last 6 years' i10 index". Also see: Universities Rankings 2024 (Sort by : Total i10 Index) and Universities Rankings 2024 (Sort by : Last 6 Years i10 Index)
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Lithography
Metrology
Optics
Sensors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
Ceramics
thin film coatings
mechanical seals
failure analysis
quality & reliability
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
Systems Engineering
Technical Leadership
High-tech Industry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
2
0.250
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
Microscopy
Nanocrystals
THz spectroscopy
pump-probe spectroscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Electron Microscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
2
0.286
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
0
0.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Sensors
MEMS
semiconductors
lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
MEMS
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
virtual reality
3D Human-Computer Interaction
semiconductor
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
2
0.333
Control
signal processing
system identification
Kalman filtering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
1
0.167
computational mechanics
materials science
crystalline materials
atomistic modelling
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Photolithography
Nano Fabrication
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Semiconductor fabrication
Plasma Physics
2D materials
Material Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Camilo Ulloa
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Maarten Voncken
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
Natarajan Thiyagarajan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
Ceramics
thin film coatings
mechanical seals
failure analysis
quality & reliability
Naseh Hosseini
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
2
0.250
Milos Popadic
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
Lucas Kunneman
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Microscopy
Nanocrystals
THz spectroscopy
pump-probe spectroscopy
Jen-Yi Wuu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Jacek Kustra
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Frank Driessen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
2
0.286
Muhsin Eralp
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
0
0.000
Xiangyun Amy Chen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Hamideh Rostami
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Herbert Crepaz
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Alexandru Onose
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Georgios Zikos
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Nikhil Mehta
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
Joseph Zekry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Tiannan Guan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Sam Crisafulli
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
1
0.167
Control
signal processing
system identification
Kalman filtering
Carolina Baruffi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
computational mechanics
materials science
crystalline materials
atomistic modelling
Chunlei Yue
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Syam Parayil Venugopalan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Semiconductor fabrication
Plasma Physics
2D materials
Material Science