i10 Productivity
Rankings
ASML Holding/ Scientists i10 Productivity Rankings 2024
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Click for "last 6 years' i10 index". Also see: Universities Rankings 2024 (Sort by : Total i10 Index) and Universities Rankings 2024 (Sort by : Last 6 Years i10 Index)
EUV
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
154
50
0.325
Microlithography for integrated circuit production
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
101
38
0.376
materials science
patterning
devices
systems
life sciences
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
88
35
0.398
lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
photolithography
simulation
photoresist
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
18
0.257
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
67
29
0.433
IoT
connectivity
sensors
sensor fusion
innovation management
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
36
0.581
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
9
0.148
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
35
0.673
comsol
matlab
simulink
modeling
simulation
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
26
0.542
photonics
nanotechnology
optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
15
0.326
EUV
Lithography
Plasma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
45
30
0.667
Correlated electron systems
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
31
0.705
Nanophotonics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
Optische lithografie
warmte en stroming
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
atomic spectroscopy
optical frequency standards
lithography
plasma physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
13
0.342
Semiconductor lithography
metrology
and inspection
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
4
0.114
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
X-ray optics
optical design
optical metrology
differential deposition
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
29
0.935
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
25
0.806
Machine learning
Pattern recognition
Data mining
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
18
0.581
EUV Lithography
laser produced plasma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
Vadim Banine
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
154
50
0.325
Timothy A. Brunner
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
Liang Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
101
38
0.376
Qinghuang Lin
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
88
35
0.398
materials science
patterning
devices
systems
life sciences
Robert Socha
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
Steven G. Hansen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
18
0.257
Stefan Hunsche
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
67
29
0.433
Harmke De Groot
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
36
0.581
IoT
connectivity
sensors
sensor fusion
innovation management
Christopher Spence
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
9
0.148
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
Stephen D. Hsu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Viktor Chikan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
35
0.673
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
Awm (Jos) Van Schijndel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
26
0.542
Se-Heon Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
15
0.326
photonics
nanotechnology
optics
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
45
30
0.667
Wolter Siemons
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
31
0.705
Yuanqing Yang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
Carlo Luijten
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
Robert J. Rafac
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
13
0.342
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Michael Lercel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
4
0.114
Amir Abdolvand
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
Kiranmayee Kilaru
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
X-ray optics
optical design
optical metrology
differential deposition
Farzad Fareed|Farzad Behafarid
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
29
0.935
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
Ilias Katsouras
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
25
0.806
Alexander Ypma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
18
0.581
Machine learning
Pattern recognition
Data mining
Lithography
Alex Schafgans
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548