NEWS
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
The 2025 AD Scientific Index is here—explore updated university and researcher rankings!
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Adam Duncan
Indiana University Bloomington - Bloomington / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1552831
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Adam Duncan's MOST POPULAR ARTICLES
1-)
Soft errors induced by high-energy electronsMJ Gadlage, AH Roach, AR Duncan, AM Williams, DP Bossev, MJ KayIEEE Transactions on Device and Materials Reliability 17 (1), 157-162, 2016462016
2-)
Electron-induced single-event upsets in 45-nm and 28-nm bulk CMOS SRAM-based FPGAs operating at nominal voltageMJ Gadlage, AH Roach, AR Duncan, MW Savage, MJ KayIEEE Transactions on Nuclear Science 62 (6), 2717-2724, 2015482015
3-)
Single-event mitigation in combinational logic using targeted data path hardeningV Srinivasan, AL Sternberg, AR Duncan, WH Robinson, BL Bhuva, ...IEEE transactions on nuclear science 52 (6), 2516-2523, 2005472005
4-)
FPGA bitstream security: a day in the lifeA Duncan, F Rahman, A Lukefahr, F Farahmandi, M Tehranipoor2019 IEEE International Test Conference (ITC), 1-10, 2019442019
5-)
Effect of accumulated charge on the total ionizing dose response of a NAND flash memoryMJ Kay, MJ Gadlage, AR Duncan, D Ingalls, A Howard, TR OldhamIEEE Transactions on Nuclear Science 59 (6), 2945-2951, 2012272012
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept