Allen Gabor

IBM Corporation - New York / United States

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AD Scientific Index ID: 4462749

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Allen Gabor's MOST POPULAR ARTICLES

1-) High performance 14nm SOI FinFET CMOS technology with 0.0174µm2 embedded DRAM and 15 levels of Cu metallization 2014 IEEE International Electron Devices Meeting, 3.8. 1-3.8. 3, 2014

2-) High performance 45-nm SOI technology with enhanced strain, porous low-k BEOL, and immersion lithography 2006 International Electron Devices Meeting, 1-4, 2006

3-) Binary OPC for assist feature layout optimization US Patent 7,001,693, 2006

4-) RTA-driven intra-die variations in stage delay, and parametric sensitivities for 65nm technology 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers., 170-171, 2006

5-) Imaging polymers with supercritical carbon dioxide Advanced Materials 9 (13), 1039-1043, 1997

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