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Andrew R Brown
Synopsys Inc - Mountain View / United States
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AD Scientific Index ID: 4391119
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Andrew R Brown's MOST POPULAR ARTICLES
1-)
Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughnessA Asenov, S Kaya, AR BrownIEEE Transactions on Electron Devices 50 (5), 1254-1260, 20037392003
2-)
Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETsA Asenov, AR Brown, JH Davies, S Kaya, G SlavchevaIEEE Transactions on Electron Devices 50 (9), 1837-1852, 20037302003
3-)
Simulation study of individual and combined sources of intrinsic parameter fluctuations in conventional nano-MOSFETsG Roy, AR Brown, F Adamu-Lema, S Roy, A AsenovIEEE Transactions on Electron Devices 53 (12), 3063-3070, 20063332006
4-)
RTS amplitudes in decananometer MOSFETs: 3-D simulation studyA Asenov, R Balasubramaniam, AR Brown, JH DaviesIEEE Transactions on Electron Devices 50 (3), 839-845, 20033302003
5-)
Statistical variability and reliability in nanoscale FinFETsX Wang, AR Brown, B Cheng, A Asenov2011 International Electron Devices Meeting, 5.4. 1-5.4. 4, 20113272011
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