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Annie Xian Zhang
Stevens Institute of Technology - Hoboken / United States
Engineering & Technology / Mechanical Engineering
AD Scientific Index ID: 1671640
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Annie Xian Zhang's MOST POPULAR ARTICLES
1-)
Measurement of the optical dielectric function of monolayer transition-metal dichalcogenides: , , , and Physical Review B 90 (20), 205422, 2014
2-)
Multi-terminal transport measurements of MoS2 using a van der Waals heterostructure device platform Nature nanotechnology 10 (6), 534-540, 2015
3-)
Highly Stable, Dual-Gated MoS2 Transistors Encapsulated by Hexagonal Boron Nitride with Gate-Controllable Contact, Resistance, and Threshold Voltage ACS nano 9 (7), 7019-7026, 2015
4-)
Measurement of Lateral and Interfacial Thermal Conductivity of Single- and Bilayer MoS2 and MoSe2 Using Refined Optothermal Raman Technique ACS applied materials & interfaces 7 (46), 25923-25929, 2015
5-)
Measurement of Lateral and Interfacial Thermal Conductivity of Single- and Bilayer MoS2 and MoSe2 Using Refined Optothermal Raman TechniqueX Zhang, D Sun, Y Li, GH Lee, X Cui, D Chenet, Y You, TF Heinz, ...ACS applied materials & interfaces 7 (46), 25923-25929, 20153732015
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