Arijit Roy

Arijit Roy

West Bengal State University - West Bengal / India
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 334105
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person_outline Arijit Roy's MOST POPULAR ARTICLES
1-) Electromigration in ULSI interconnectsCM Tan, A RoyMaterials Science and Engineering: R: Reports 58 (1-2), 1-75, 20072542007
2-) Investigation of the effect of temperature and stress gradients on accelerated EM test for Cu narrow interconnectsCM Tan, A RoyThin Solid Films 504 (1-2), 288-293, 2006672006
3-) Current crowding effect on copper dual damascene via bottom failure for ULSI applicationsCM Tan, A Roy, AV Vairagar, A Krishnamoorthy, SG MhaisalkarIEEE Transactions on Device and Materials Reliability 5 (2), 198-205, 2005602005
4-) Probing into the asymmetric nature of electromigration performance of submicron interconnect via structureA Roy, CM TanThin solid films 515 (7-8), 3867-3874, 2007352007
5-) Very high current density package level electromigration test for copper interconnectsA Roy, CM TanJournal of applied physics 103 (9), 2008312008