Augusto Tazzoli

Augusto Tazzoli

Carnegie Mellon University - Pittsburgh / United States
Others
AD Scientific Index ID: 892503
person_outline Augusto Tazzoli's MOST POPULAR ARTICLES
1-) Reliability of GaN high-electron-mobility transistors: State of the art and perspectivesG Meneghesso, G Verzellesi, F Danesin, F Rampazzo, F Zanon, A Tazzoli, ...IEEE Transactions on Device and Materials Reliability 8 (2), 332-343, 20086932008
2-) A review on the physical mechanisms that limit the reliability of GaN-based LEDsM Meneghini, A Tazzoli, G Mura, G Meneghesso, E ZanoniIEEE Transactions on Electron Devices 57 (1), 108-118, 20093052009
3-) Reliability issues of gallium nitride high electron mobility transistorsG Meneghesso, M Meneghini, A Tazzoli, A Stocco, A Chini, E ZanoniInternational Journal of Microwave and Wireless Technologies 2 (1), 39-50, 20101252010
4-) Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hour on-state and off-state hot-electron stressA Sozza, C Dua, E Morvan, S Delage, F Rampazzo, A Tazzoli, F Danesin, ...IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 4 …, 20051172005
5-) A review of failure modes and mechanisms of GaN-based HEMTsE Zanoni, G Meneghesso, G Verzellesi, F Danesin, M Meneghini, ...2007 IEEE International Electron Devices Meeting, 381-384, 2007612007