NEWS
New Feature!!!! University Subject Rankings in 12 branches
FOR SCIENTIST REGISTRATION FOR INSTITUTIONAL BULK REGISTRATION
FOR EDIT YOUR UNIVERSITY / INSTITUTION PAGE
Some differences of the AD Scientific Index
New Feature!!!! University Subject Rankings in 12 branches
List without CERN, Statistical Data etc. Only in AD Scientific Index
New Feature!!!! University Subject Rankings in 12 branches
AD
Scientific Index 2024
About Us
Methodology
Compare & Choose
Contact - FAQ
login
Login
person_add
Register
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
school
University Rankings
subject
University Subject Rankings
insights
Subject Rankings
place
Country Rankings
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
local_fire_department
Country Top Lists
Bernhard Lippmann
Infineon Technologies - - / Germany
Natural Sciences / Physics
AD Scientific Index ID: 5387557
Edit Form
Registration, Add Profile,
Premium Membership
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Bernhard Lippmann's MOST POPULAR ARTICLES
1-)
System and method for integrated circuit planar netlist interpretationB Lippmann, A JunghannsUS Patent 7,937,678, 2011672011
2-)
Integrated flow for reverse engineering of nanoscale technologiesB Lippmann, M Werner, N Unverricht, A Singla, P Egger, A Dübotzky, ...Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019392019
3-)
Verification of physical designs using an integrated reverse engineering flow for nanoscale technologiesB Lippmann, N Unverricht, A Singla, M Ludwig, M Werner, P Egger, ...Integration 71, 11-29, 2020342020
4-)
Reverse engineering of cryptographic cores by structural interpretation through graph analysisM Werner, B Lippmann, J Baehr, H Gräb2018 IEEE 3rd International Verification and Security Workshop (IVSW), 13-18, 2018262018
5-)
Semiconductor device and production processB Lippmann, S Wallstab, G Schmid, R LeuschnerUS Patent 7,122,899, 2006182006
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept