Bert Voigtländer

Bert Voigtländer

Forschungszentrum Jülich - / Germany
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4475428
Jülich Research Centre
person_outline Bert Voigtländer's MOST POPULAR ARTICLES
1-) Fundamental processes in Si/Si and Ge/Si epitaxy studied by scanning tunneling microscopy during growthB VoigtländerSurface Science Reports 43 (5-8), 127-254, 20015042001
2-) Epitaxial growth of thin magnetic cobalt films on Au (111) studied by scanning tunneling microscopyB Voigtländer, G Meyer, NM AmerPhysical Review B 44 (18), 10354, 19914971991
3-) Scanning probe microscopy: Atomic force microscopy and scanning tunneling microscopyB VoigtländerSpringer, 20154382015
4-) Modification of growth kinetics in surfactant-mediated epitaxyB Voigtländer, A Zinner, T Weber, HP BonzelPhysical Review B 51 (12), 7583, 19952881995
5-) Kinetically self-limiting growth of Ge islands on Si (001)M Kästner, B VoigtländerPhysical review letters 82 (13), 2745, 19992531999