Bing-Yang Lin

National Tsing Hua University Taiwan - Hsinchu / Taiwan

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AD Scientific Index ID: 5532653

國立清華大學

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Bing-Yang Lin's MOST POPULAR ARTICLES

1-) A memory yield improvement scheme combining built-in self-repair and error correction codesTH Wu, PY Chen, M Lee, BY Lin, CW Wu, CH Tien, HC Lin, H Chen, ...2012 IEEE International Test Conference, 1-9, 2012382012

2-) Test cost reduction methodology for InFO wafer-level chip-scale packageKL Wang, BY Lin, CW Wu, M Lee, H Chen, HC Lin, CN Peng, MJ WangIEEE Design & Test 34 (3), 50-58, 2016152016

3-) On improving interconnect defect diagnosis resolution and yield for interposer-based 3-D ICsCC Chi, BY Lin, CW Wu, MJ Wang, HC Lin, CN PengIEEE Design & Test 31 (4), 16-26, 2014

4-) A memory failure pattern analyzer for memory diagnosis and repairBY Lin, M Lee, CW Wu2012 IEEE 30th VLSI Test Symposium (VTS), 234-239, 2012

5-) A built-off self-repair scheme for channel-based 3D memoriesHH Liu, BY Lin, CW Wu, WT Chiang, L Mincent, HC Lin, CN Peng, ...IEEE Transactions on Computers 66 (8), 1293-1301, 2017

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