NEWS
Print Your Certificate
The 2025 AD Scientific Index is here—explore updated university and researcher rankings!
New! Young University / Institution Rankings 2025
New! The 2025 Edition of the AD Scientific Index is now live!
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
"Exciting Update! The 2025 Edition of the AD Scientific Index is now live!
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Bo Wen
Tohoku University - Sendai / Japan
Others
AD Scientific Index ID: 4865952
東北大学
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Bo Wen's MOST POPULAR ARTICLES
1-)
On-machine profile measurement of a micro cutting edge by using a contact-type compact probe unitB Wen, Y Shimizu, Y Watanabe, H Matsukuma, W GaoPrecision Engineering 65, 230-239, 202082020
2-)
Design and construction of a low-force stylus probe for on-machine tool cutting edge measurementH Matsukuma, B Wen, S Osawa, S Sekine, Y Shimizu, W GaoNanomanufacturing and Metrology 3, 282-291, 202072020
3-)
A differential strategy for measurement of a static force in a single-point diamond cutting by a force-controlled fast tool servoB Wen, Y Shimizu, H Matsukuma, K Tohyama, H Kurita, YL Chen, W GaoMeasurement Science and Technology 31 (7), 074014, 202032020
4-)
Force Controlled Stylus Probes for On-Machine Surface MetrologyB WenTohoku University, 20222022
5-)
A Comparison of the Probes with a Cantilever Beam and a Double-Sided Beam in the Tool Edge Profiler for On-Machine Measurement of a Precision Cutting ToolB Wen, S Sekine, S Osawa, Y Shimizu, H Matsukuma, A Archenti, W GaoMachines 9 (11), 271, 20212021
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept