Brad Jc Chiou

Brad Jc Chiou

Micron Technology Inc - - / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 5675076
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person_outline Brad Jc Chiou's MOST POPULAR ARTICLES
1-) The processing windows for selective copper chemical vapor deposition from Cu (hexafluoroacetylacetonate) trimethylvinylsilaneJC Chiou, KC Juang, MC ChenJournal of the Electrochemical Society 142 (1), 177, 1995661995
2-) Copper chemical vapor deposition from Cu (hexafluoroacetylacetonate) trimethylvinylsilaneJC Chiou, YJ Chen, MC ChenJournal of electronic materials 23, 383-390, 1994341994
3-) Dielectric degradation of Cu/SiO2/Si structure during thermal annealingJC Chiou, H Wang, MC ChenJournal of the Electrochemical Society 143 (3), 990, 1996331996
4-) TiW (N) as diffusion barriers between Cu and SiJC Chiou, KC Juang, MC ChenJournal of the Electrochemical Society 142 (7), 2326, 1995301995
5-) Thermal Stability of Cu/CoSi2 Contacted p+ n Shallow Junction with and without TiW Diffusion BarrierJC Chiou, MC ChenJournal of The Electrochemical Society 141 (10), 2804, 1994191994