NEWS
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Cedric Virmontois
Centre national d'études spatiales - Paris / France
Others
AD Scientific Index ID: 4410960
-
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Cedric Virmontois's MOST POPULAR ARTICLES
1-)
The SuperCam instrument suite on the Mars 2020 rover: science objectives and mast-unit descriptionS Maurice, RC Wiens, P Bernardi, P Caïs, S Robinson, T Nelson, ...Space Science Reviews 217, 1-108, 20211062021
2-)
Radiation effects in pinned photodiode CMOS image sensors: Pixel performance degradation due to total ionizing doseV Goiffon, M Estribeau, O Marcelot, P Cervantes, P Magnan, M Gaillardin, ...IEEE Transactions on Nuclear Science 59 (6), 2878-2887, 20121002012
3-)
Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technologyC Virmontois, V Goiffon, P Magnan, S Girard, C Inguimbert, S Petit, ...IEEE Transactions on Nuclear Science 57 (6), 3101-3108, 2010722010
4-)
Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensorsC Virmontois, V Goiffon, P Magnan, O Saint-Pé, S Girard, S Petit, ...IEEE Transactions on Nuclear Science 58 (6), 3085-3094, 2011772011
5-)
Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurementsV Goiffon, C Virmontois, P Magnan, S Girard, P PailletIEEE Transactions on Nuclear Science 57 (6), 3087-3094, 2010752010
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept