Cen Chen

Cen Chen

Harbin Institute of Technology - Harbin / China
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4567671
哈尔滨技术学院
person_outline Cen Chen's MOST POPULAR ARTICLES
1-) Online condition monitoring of power MOSFET gate oxide degradation based on miller platform voltage IEEE Transactions on Power Electronics 32 (6), 4776-4784, 2016
2-) An adaptive optimized TVF-EMD based on a sparsity-impact measure index for bearing incipient fault diagnosis IEEE Transactions on Instrumentation and Measurement 70, 1-11, 2020
3-) Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process Reliability Engineering & System Safety 217, 108087, 2022
4-) A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling Reliability Engineering & System Safety 228, 108815, 2022
5-) PHM application of power converters using health precursor of power MOSFETs 2015 Prognostics and System Health Management Conference (PHM), 1-5, 2015