Chang Seok Kang

Chang Seok Kang

Applied Materials, Inc. - Santa Clara / United States
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4375744
person_outline Chang Seok Kang's MOST POPULAR ARTICLES
1-) Electrical and spectroscopic comparison of HfO2/Si interfaces on nitrided and un-nitrided Si(100) J. Appl. Phys. 91, 4353, 2003
2-) A comparative study on the electrical conduction mechanisms of thin films on Pt and electrodes Journal of applied physics 83 (7), 3703-3713, 1998
3-) Bonding states and electrical properties of ultrathin gate dielectrics Applied Physics Letters 81 (14), 2593-2595, 2002
4-) Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and thin films Journal of applied physics 85 (1), 287-295, 1999
5-) Bias-temperature instabilities of polysilicon gate HfO/sub 2/MOSFETs IEEE Transactions on Electron Devices 50 (6), 1517-1524, 2003