NEWS
Free Institutional Consultancy Services
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Chenming Hu
University of California Berkeley - Berkeley / United States
Others
AD Scientific Index ID: 1731563
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Subject Leaders
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Chenming Hu's MOST POPULAR ARTICLES
1-)
FinFET-a self-aligned double-gate MOSFET scalable to 20 nmD Hisamoto, WC Lee, J Kedzierski, H Takeuchi, K Asano, C Kuo, ...IEEE transactions on electron devices 47 (12), 2320-2325, 200021802000
2-)
Hot-electron-induced MOSFET degradation-model, monitor, and improvementC Hu, SC Tam, FC Hsu, PK Ko, TY Chan, KW TerrillIEEE Journal of Solid-State Circuits 20 (1), 295-305, 198518731985
3-)
MoS2 transistors with 1-nanometer gate lengthsSB Desai, SR Madhvapathy, AB Sachid, JP Llinas, Q Wang, GH Ahn, ...Science 354 (6308), 99-102, 201611002016
4-)
A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistorsKK Hung, PK Ko, C Hu, YC ChengIEEE Transactions on Electron Devices 37 (3), 654-665, 199010801990
5-)
Modern semiconductor devices for integrated circuitsC Hu(No Title), 20109042010
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept