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Chetan Prasad
Intel Corporation - Kaliforniya / United States
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AD Scientific Index ID: 4376750
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Chetan Prasad's MOST POPULAR ARTICLES
1-)
A 45nm logic technology with high-k+ metal gate transistors, strained silicon, 9 Cu interconnect layers, 193nm dry patterning, and 100% Pb-free packagingK Mistry, C Allen, C Auth, B Beattie, D Bergstrom, M Bost, M Brazier, ...2007 IEEE International Electron Devices Meeting, 247-250, 200714972007
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BTI reliability of 45 nm high-K+ metal-gate process technologyS Pae, M Agostinelli, M Brazier, R Chau, G Dewey, T Ghani, M Hattendorf, ...2008 IEEE International Reliability Physics Symposium, 352-357, 20081502008
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45nm Transistor Reliability.J Hicks, D Bergstrom, M Hattendorf, J Jopling, J Maiz, S Pae, C Prasad, ...Intel Technology Journal 12 (2), 20081192008
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Self-heat reliability considerations on Intel\'s 22nm Tri-Gate technologyC Prasad, L Jiang, D Singh, M Agostinelli, C Auth, P Bai, T Eiles, J Hicks, ...2013 IEEE International Reliability Physics Symposium (IRPS), 5D. 1.1-5D. 1.5, 20131212013
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A 14 nm SoC platform technology featuring 2nd generation Tri-Gate transistors, 70 nm gate pitch, 52 nm metal pitch, and 0.0499 um2 SRAM cells, optimized for …CH Jan, F Al-Amoody, HY Chang, T Chang, YW Chen, N Dias, W Hafez, ...2015 Symposium on VLSI Technology (VLSI Technology), T12-T13, 20151032015
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