Christiaan Kok

Christiaan Kok

Philips Research - Eindhoven / Netherlands
Others
AD Scientific Index ID: 5660304
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person_outline Christiaan Kok's MOST POPULAR ARTICLES
1-) Microphase separation at two length scalesRJ Nap, C Kok, G Ten Brinke, SI KuchanovThe European Physical Journal E 4, 515-519, 2001672001
2-) Method for determining the aberration coefficients of the aberration function of a particle-optical lensMJ van der Zande, C Kok, B RiegerUS Patent 7,544,939, 200992009
3-) Molecular Inhomogeneity and Scattering Properties of Products of “Living” Anionic CopolymerizationS Kuchanov, C Kok, G Ten BrinkeMacromolecules 35 (20), 7804-7814, 200282002
4-) Device and method for aligning an X-ray grating to an X-ray radiation source, and X-ray image acquisition systemC Kok, G Vogtmeier, T Koehler, JWM Jacobs, S Unnikrishnan, D Hermes, ...US Patent 10,959,693, 202152021
5-) X-ray imaging apparatus for compact (quasi-) isotropic multi source x-ray imagingH Steinhauser, C KokUS Patent 11,058,375, 202122021