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Daniel Rugar
IBM Corporation - New York / United States
Natural Sciences / Physics
AD Scientific Index ID: 4463216
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Daniel Rugar's MOST POPULAR ARTICLES
1-)
Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivityTR Albrecht, P Grütter, D Horne, D RugarJournal of applied physics 69 (2), 668-673, 199131111991
2-)
Single-spin magnetic resonance force microscopyD Rugar, R Budakian, HJ Mamin, BW ChuiNature 430, 329-332, 200420852004
3-)
Atomic force microscopyD Rugar, P HansmaPhysics today 43 (10), 23-30, 199010381990
4-)
Improved fiber‐optic interferometer for atomic force microscopyD Rugar, HJ Mamin, P GuethnerApplied Physics Letters 55 (25), 2588-2590, 19899241989
5-)
Quality factors in micron-and submicron-thick cantileversKY Yasumura, TD Stowe, EM Chow, T Pfafman, TW Kenny, BC Stipe, ...Journal of microelectromechanical systems 9 (1), 117-125, 20009122000
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