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Dave Reid
Synopsys Inc - Mountain View / United States
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AD Scientific Index ID: 4393851
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Dave Reid's MOST POPULAR ARTICLES
1-)
Analysis of threshold voltage distribution due to random dopants: A 100 000-sample 3-D simulation studyD Reid, C Millar, G Roy, S Roy, A AsenovIEEE Transactions on Electron Devices 56 (10), 2255-2263, 2009872009
2-)
Accurate statistical description of random dopant-induced threshold voltage variabilityC Millar, D Reid, G Roy, S Roy, A AsenovIEEE Electron Device Letters 29 (8), 946-948, 2008872008
3-)
Understanding LER-Induced MOSFET Variability—Part I: Three-Dimensional Simulation of Large Statistical SamplesD Reid, C Millar, S Roy, A AsenovIEEE Transactions on Electron Devices 57 (11), 2801-2807, 2010552010
4-)
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A reviewL Gerrer, J Ding, SM Amoroso, F Adamu-Lema, R Hussin, D Reid, C Millar, ...Microelectronics Reliability 54 (4), 682-697, 2014502014
5-)
Advanced simulation of statistical variability and reliability in nano CMOS transistorsA Asenov, S Roy, RA Brown, G Roy, C Alexander, C Riddet, C Millar, ...2008 IEEE International Electron Devices Meeting, 1-1, 2008502008
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