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David G Seiler
AD Scientific Index 2024
Engineering & Technology / Electrical & Electronic Engineering
National Institute of Standards and Technology - Maryland / United States
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David G Seiler's MOST POPULAR ARTICLES
1-)
Characterization of ultra-thin oxides using electrical CV and IV measurementsJR Hauser, K AhmedAIP Conference Proceedings 449 (1), 235-239, 19984881998
2-)
Characterization of two‐dimensional dopant profiles: Status and reviewAC Diebold, MR Kump, JJ Kopanski, DG SeilerJournal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 19961141996
3-)
Temperature dependence of the energy gap of InSb using nonlinear optical techniquesCL Littler, DG SeilerApplied Physics Letters 46 (10), 986-988, 19851131985
4-)
Overview of scatterometry applications in high volume silicon manufacturingC RaymondAIP Conference Proceedings 788 (1), 394-402, 20051102005
5-)
Multicarrier characterization method for extracting mobilities and carrier densities of semiconductors from variable magnetic field measurementsJS Kim, DG Seiler, WF TsengJournal of applied physics 73 (12), 8324-8335, 19931101993
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