David G Seiler

David G Seiler

National Institute of Standards and Technology - Maryland / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4393949
person_outline David G Seiler's MOST POPULAR ARTICLES
1-) Characterization of ultra-thin oxides using electrical CV and IV measurements AIP Conference Proceedings 449 (1), 235-239, 1998
2-) Characterization of two‐dimensional dopant profiles: Status and review Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
3-) Overview of scatterometry applications in high volume silicon manufacturing AIP Conference Proceedings 788 (1), 394-402, 2005
4-) Temperature dependence of the energy gap of InSb using nonlinear optical techniques Applied Physics Letters 46 (10), 986-988, 1985
5-) Multicarrier characterization method for extracting mobilities and carrier densities of semiconductors from variable magnetic field measurements Journal of applied physics 73 (12), 8324-8335, 1993