David Mercier

David Mercier

Ansys - Canonsburg / United States
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4969352
person_outline David Mercier's MOST POPULAR ARTICLES
1-) Capacitance-voltage characterization of GaAs–Al2O3 interfaces Applied Physics Letters 93 (18), 2008
2-) Fabrication and characterisation of 200 mm germanium-on-insulator (GeOI) substrates made from bulk germanium Electronics Letters 42 (7), 415-417, 2006
3-) Investigation of Cr (N)/DLC multilayer coatings elaborated by PVD for high wear resistance and low friction applications Surface and Coatings Technology 337, 396-403, 2018
4-) Capacitance–voltage characterization of GaAs–oxide interfaces Journal of the Electrochemical Society 155 (12), H945, 2008
5-) Quantifying deformation processes near grain boundaries in α titanium using nanoindentation and crystal plasticity modeling International Journal of Plasticity, 2016