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Don Dick
Savannah River National Laboratory - Aiken / United States
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AD Scientific Index ID: 4597723
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Don Dick's MOST POPULAR ARTICLES
1-)
Controlling the atomic layer deposition of titanium dioxide on silicon: dependence on surface terminationS McDonnell, RC Longo, O Seitz, JB Ballard, G Mordi, D Dick, JHG Owen, ...The Journal of Physical Chemistry C 117 (39), 20250-20259, 2013672013
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Surface etching, chemical modification and characterization of silicon nitride and silicon oxide—selective functionalization of Si3N4 and SiO2LH Liu, DJ Michalak, TP Chopra, SP Pujari, W Cabrera, D Dick, JF Veyan, ...Journal of Physics: Condensed Matter 28 (9), 094014, 2016502016
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Selectivity of metal oxide atomic layer deposition on hydrogen terminated and oxidized Si (001)-(2× 1) surfaceRC Longo, S McDonnell, D Dick, RM Wallace, YJ Chabal, JHG Owen, ...Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014452014
4-)
Hyper‐Raman spectroscopy of CeO2E Villa‐Aleman, AL Houk, DD Dick, SE Hunyadi MurphJournal of Raman Spectroscopy 51 (7), 1260-1263, 2020382020
5-)
Pattern transfer of hydrogen depassivation lithography patterns into silicon with atomically traceable placement and size controlJB Ballard, JHG Owen, W Owen, JR Alexander, E Fuchs, JN Randall, ...Journal of Vacuum Science & Technology B 32 (4), 2014312014
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