E Todd Ryan

E Todd Ryan

Intel Corporation - California / United States
Natural Sciences / Chemical Sciences
AD Scientific Index ID: 4376697
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person_outline E Todd Ryan's MOST POPULAR ARTICLES
1-) Low dielectric constant materials for ULSI interconnectsM Morgen, ET Ryan, JH Zhao, C Hu, T Cho, PS HoAnnual Review of Materials Science 30 (1), 645-680, 20004912000
2-) Positronium annihilation in mesoporous thin filmsDW Gidley, WE Frieze, TL Dull, AF Yee, ET Ryan, HM HoPhysical Review B 60 (8), R5157, 19993541999
3-) Methods of forming graphene liners and/or cap layers on copper-based conductive structuresET Ryan, Z Krivokapic, X Zhang, C Witt, M He, L ZhaoUS Patent App. 13/684,871, 20142972014
4-) Progress in the development and understanding of advanced low k and ultralow k dielectrics for very large-scale integrated interconnects—State of the artA Grill, SM Gates, TE Ryan, SV Nguyen, D PriyadarshiniApplied Physics Reviews 1 (1), 20143222014
5-) Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scatteringW Wu, WE Wallace, EK Lin, GW Lynn, CJ Glinka, ET Ryan, HM HoJournal of applied physics 87 (3), 1193-1200, 20002092000