Eduardo Alves

Eduardo Alves

Universidade de Lisboa - Lisboa / Portugal
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4989193
University of Lisbon
person_outline Eduardo Alves's MOST POPULAR ARTICLES
1-) Effect of post-annealing on the properties of copper oxide thin films obtained from the oxidation of evaporated metallic copper V Figueiredo, E Elangovan, G Goncalves, P Barquinha, L Pereira, ... Applied Surface Science 254 (13), 3949-3954, 2008 2952008
2-) Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping S Pereira, MR Correia, E Pereira, KP O’Donnell, E Alves, AD Sequeira, ... Applied physics letters 80 (21), 3913-3915, 2002 2712002
3-) Compositional pulling effects in In x Ga 1− x N/G a N layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling studyS Pereira, MR Correia, E Pereira, KP O’donnell, C Trager-Cowan, ...Physical Review B 64 (20), 205311, 20012762001
4-) Structural, optical and mechanical properties of coloured TiNxOy thin filmsF Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ...Thin Solid Films 447, 449-454, 2004
5-) Characterisation of Ti1− xSixNy nanocomposite filmsF Vaz, L Rebouta, P Goudeau, J Pacaud, H Garem, JP Riviere, ...Surface and Coatings Technology 133, 307-313, 2000