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Erwin J Prinz
NXP Semiconductors - Eindhoven / Netherlands
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AD Scientific Index ID: 4969915
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Erwin J Prinz's MOST POPULAR ARTICLES
1-)
The Effects of Base Dopant Outdiffusion and Undoped Si1-xGexJunction Spacer Layers in Si/Si1_xGex/Si Heterojunction Bipolar Transistors EJ Prinz, PM Garone, PV Schwartz, X Xiao, JC Sturm IEEE electron device letters 12 (2), 42-44, 1991 159*1991
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Silicon nanocrystal based memory devices for NVM and DRAM applications RA Rao, RF Steimle, M Sadd, CT Swift, B Hradsky, S Straub, T Merchant, ... Solid-State Electronics 48 (9), 1463-1473, 2004 1242004
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Growth of Si1−xGex by rapid thermal chemical vapor deposition and application to heterojunction bipolar transistorsJC Sturm, PV Schwartz, EJ Prinz, H ManoharanJournal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 19911231991
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A 6 V embedded 90 nm silicon nanocrystal nonvolatile memoryR Muralidhar, RF Steimle, M Sadd, R Rao, CT Swift, EJ Prinz, J Yater, ...IEEE International Electron Devices Meeting 2003, 26.2. 1-26.2. 4, 20031182003
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High quantum efficiency photoluminescence from localized excitons in Si1− xGexLC Lenchyshyn, MLW Thewalt, JC Sturm, PV Schwartz, EJ Prinz, ...Applied physics letters 60 (25), 3174-3176, 19921011992
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