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Eugene Chong
Agency for Defense Development, Korea - - / South Korea
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AD Scientific Index ID: 4404587
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Eugene Chong's MOST POPULAR ARTICLES
1-)
High stability of amorphous hafnium-indium-zinc-oxide thin film transistorE Chong, KC Jo, SY LeeApplied Physics Letters 96 (15), 152102, 20101542010
2-)
Effect of channel thickness on density of states in amorphous InGaZnO thin film transistorSY Lee, DH Kim, E Chong, YW Jeon, DH KimApplied Physics Letters 98 (12), 122105, 20111222011
3-)
Amorphous silicon–indium–zinc oxide semiconductor thin film transistors processed below E Chong, YS Chun, SY LeeApplied Physics Letters 97 (10), 102102, 20101052010
4-)
Role of silicon in silicon-indium-zinc-oxide thin-film transistorE Chong, SH Kim, SY LeeApplied Physics Letters 97 (25), 2010662010
5-)
Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stressB Kim, E Chong, H Do Kim, Y Woo Jeon, D Hwan Kim, S Yeol LeeApplied Physics Letters 99 (6), 2011602011
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