Fangming Ye

Fangming Ye

Facebook Inc - Camridge / United States
Engineering & Technology / Computer Science
AD Scientific Index ID: 4482940
person_outline Fangming Ye's MOST POPULAR ARTICLES
1-) TSV open defects in 3D integrated circuits: Characterization, test, and optimal spare allocationF Ye, K ChakrabartyDAC Design Automation Conference 2012, 1024-1030, 20121272012
2-) Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority votingF Ye, Z Zhang, K Chakrabarty, X GuIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 20131032013
3-) TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-testK Chakrabarty, S Deutsch, H Thapliyal, F Ye2012 IEEE International Reliability Physics Symposium (IRPS), 5F. 1.1-5F. 1.12, 2012772012
4-) Board-level functional fault diagnosis using multikernel support vector machines and incremental learningF Ye, Z Zhang, K Chakrabarty, X GuIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014842014
5-) On effective and efficient in-field TSV repair for stacked 3D ICsL Jiang, F Ye, Q Xu, K Chakrabarty, B EklowProceedings of the 50th Annual Design Automation Conference, 1-6, 2013562013