Federico Venini

Federico Venini

Advanced Micro Devices, Inc - - / United States
Architecture and Design / Design
AD Scientific Index ID: 5325357
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person_outline Federico Venini's MOST POPULAR ARTICLES
1-) A comprehensive methodology for stress procedures evaluation and comparison for burn-in of automotive SoCD Appello, P Bernardi, G Giacopelli, A Motta, A Pagani, G Pollaccia, ...Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017232017
2-) Robustness in automotive electronics: An industrial overview of major concernsU Backhausen, O Ballan, P Bemardi, S De Luca, J Henzler, T Kern, ...2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017142017
3-) An optimized test during burn-in for automotive SoCD Appello, C Bugeja, G Pollaccia, P Bernardi, R Cantoro, M Restifo, ...IEEE Design & Test 35 (3), 46-53, 2018132018
4-) A DMA and CACHE-based stress schema for burn-in of automotive microcontrollerP Bernardi, R Cantoro, L Gianotto, M Restifo, E Sánchez, F Venini, ...2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017102017
5-) Evaluation of ISO 26262 and IEC 61508 metrics for transient faults of a multi-processor system-on-chip through radiation testingO Ballan, P Maillard, J Arver, C Smith, R Petersson, A Griessing, F VeniniMicroelectronics Reliability 107, 113601, 202092020