Fodor Balint

Fodor Balint

Semilab Semiconductor Physics Laboratory Co. Ltd. - Budapest / Hungary
Others
AD Scientific Index ID: 5093325
person_outline Fodor Balint's MOST POPULAR ARTICLES
1-) Approaches to calculate the dielectric function of ZnO around the band gap E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik Thin Solid Films 571, 684-688, 2014 322014
2-) Porosity and thickness characterization of porous Si and oxidized porous Si layers–An ultraviolet–visible–mid infrared ellipsometry studyB Fodor, E Agocs, B Bardet, T Defforge, F Cayrel, D Alquier, M Fried, ...microporous and mesoporous materials 227, 112-120, 2016302016
3-) Near-infrared optical properties and proposed phase-change usefulness of transition metal disulfidesA Singh, Y Li, B Fodor, L Makai, J Zhou, H Xu, A Akey, J Li, R JaramilloApplied Physics Letters 115 (16), 2019292019
4-) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowiresB Fodor, T Defforge, E Agócs, M Fried, G Gautier, P PetrikApplied Surface Science 421, 397-404, 2017272017
5-) Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element methodB Fodor, P Kozma, S Burger, M Fried, P PetrikThin Solid Films 617, 20-24, 2016272016