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Hai Jiang
AD Scientific Index 2024
Engineering & Technology / Electrical & Electronic Engineering
Samsung Electronics, South Korea - / South Korea
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Hai Jiang's MOST POPULAR ARTICLES
1-)
The Impact of Self-Heating on HCI Reliability in High-Performance Digital CircuitsH Jiang, SH Shin, X Liu, X Zhang, MA AlamIEEE Electron Device Letters 38 (4), 430-433, 2017342017
2-)
A device-to-system perspective regarding self-heating enhanced hot carrier degradation in modern field-effect transistors: A topical reviewMA Alam, BK Mahajan, YP Chen, W Ahn, H Jiang, SH ShinIEEE Transactions on Electron Devices 66 (11), 4556-4565, 2019412019
3-)
Integrated modeling of self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuitsW Ahn, SH Shin, C Jiang, H Jiang, MA Wahab, MA AlamMicroelectronics Reliability 81, 262-273, 2018402018
4-)
Characterization of self-heating leads to universal scaling of HCI degradation of multi-fin SOI FinFETsH Jiang, SH Shin, X Liu, X Zhang, MA Alam2016 IEEE International Reliability Physics Symposium (IRPS), 2A-3-1-2A-3-7, 2016402016
5-)
Investigation of self-heating effect on hot carrier degradation in multiple-fin SOI FinFETsH Jiang, X Liu, N Xu, Y He, G Du, X ZhangIEEE Electron Device Letters 36 (12), 1258-1260, 2015382015
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