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Hyeonchan Lim
Yonsei University - Seoul / South Korea
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AD Scientific Index ID: 6086568
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Hyeonchan Lim's MOST POPULAR ARTICLES
1-)
Scan chain reordering-aware X-filling and stitching for scan shift power reductionS Seo, Y Lee, H Lim, J Lee, H Yoo, Y Kim, S Kang2015 IEEE 24th Asian Test Symposium (ATS), 1-6, 2015232015
2-)
Grouping-based TSV test architecture for resistive open and bridge defects in 3-D-ICsY Lee, H Lim, S KangIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016162016
3-)
Robust secure shield architecture for detection and protection against invasive attacksY Lee, H Lim, Y Lee, S KangIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019132019
4-)
Efficient systolic-array redundancy architecture for offline/online repairK Cho, I Lee, H Lim, S KangElectronics 9 (2), 338, 2020102020
5-)
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoderS Seo, H Lim, S Kang, S Kang2017 18th International Symposium on Quality Electronic Design (ISQED), 191-195, 201792017
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