Igor Krylov

Igor Krylov

Technion Israel Institute of Technology - Haifa / Israel
Natural Sciences / Physics
AD Scientific Index ID: 361942
הטכניון – מכון טכנולוגי לישראל
person_outline Igor Krylov's MOST POPULAR ARTICLES
1-) Experimental evidence for the correlation between the weak inversion hump and near midgap states in dielectric/InGaAs interfacesI Krylov, L Kornblum, A Gavrilov, D Ritter, M EizenbergApplied Physics Letters 100 (17), 173508, 2012552012
2-) The physical origin of dispersion in accumulation in InGaAs based metal oxide semiconductor gate stacksI Krylov, D Ritter, M EizenbergJournal of Applied Physics 117 (17), 174501, 2015412015
3-) Indium outdiffusion and leakage degradation in metal/Al2O3/In0. 53Ga0. 47As capacitorsI Krylov, A Gavrilov, M Eizenberg, D RitterApplied Physics Letters 103 (5), 2013332013
4-) Correlation between Ga-O signature and midgap states at the Al2O3/In0. 53Ga0. 47As interfaceI Krylov, A Gavrilov, M Eizenberg, D RitterApplied Physics Letters 101 (6), 2012332012
5-) Ferroelectricity of as-deposited HZO fabricated by plasma-enhanced atomic layer deposition at 300° C by inserting TiO2 interlayersY Qi, X Xu, I Krylov, M EizenbergApplied Physics Letters 118 (3), 2021302021