Ivo De Jong

Ivo De Jong

ASML Holding - / Netherlands
Others
AD Scientific Index ID: 4965691
person_outline Ivo De Jong's MOST POPULAR ARTICLES
1-) Process mining applied to the test process of wafer scanners in ASMLA Rozinat, ISM de Jong, CW Günther, WMP van der AalstIEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and …, 20091892009
2-) EUV lithography at chipmakers has started: performance validation of ASML\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'s NXE: 3100C Wagner, J Bacelar, N Harned, E Loopstra, S Hendriks, I De Jong, ...Extreme Ultraviolet (EUV) Lithography II 7969, 499-510, 2011572011
3-) Process mining of test processes: A case studyA Rozinat, ISM De Jong, CW Günther, WMP van der AalstTechnische Universiteit Eindhoven, 2007462007
4-) From performance validation to volume introduction of ASML\'s NXE platformH Meiling, W de Boeij, F Bornebroek, N Harned, I de Jong, P Kűrz, ...Extreme Ultraviolet (EUV) Lithography III 8322, 439-450, 2012382012
5-) Test sequencing in complex manufacturing systemsR Boumen, ISM de Jong, JWH Vermunt, JM van de Mortel-Fronczak, ...IEEE Transactions on Systems, Man, and Cybernetics-Part A: Systems and …, 2007302007