Jacopo Franco

Jacopo Franco

Interuniversity Microelectronics Centre - Leuven / Belgium
Others
AD Scientific Index ID: 4983565
person_outline Jacopo Franco's MOST POPULAR ARTICLES
1-) The paradigm shift in understanding the bias temperature instability: From reaction–diffusion to switching oxide traps T Grasser, B Kaczer, W Goes, H Reisinger, T Aichinger, P Hehenberger, ... IEEE Transactions on Electron Devices 58 (11), 3652-3666, 2011 4842011
2-) Origin of NBTI variability in deeply scaled pFETs B Kaczer, T Grasser, PJ Roussel, J Franco, R Degraeve, LA Ragnarsson, ... 2010 IEEE International Reliability Physics Symposium, 26-32, 2010 3522010
3-) Comphy—A compact-physics framework for unified modeling of BTI G Rzepa, J Franco, B O’Sullivan, A Subirats, M Simicic, G Hellings, ... Microelectronics Reliability 85, 49-65, 2018 1372018
4-) Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseT Grasser, H Reisinger, W Goes, T Aichinger, P Hehenberger, PJ Wagner, ...2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 20091492009
5-) Recent advances in understanding the bias temperature instabilityT Grasser, B Kaczer, W Goes, H Reisinger, T Aichinger, P Hehenberger, ...2010 international electron devices meeting, 4.4. 1-4.4. 4, 20101372010