Javier Diaz Fortuny|J. Diaz

Javier Diaz Fortuny|J. Diaz

Interuniversity Microelectronics Centre - Leuven / Belgium
Others
AD Scientific Index ID: 5437013
person_outline Javier Diaz Fortuny|J. Diaz's MOST POPULAR ARTICLES
1-) New weighted time lag method for the analysis of random telegraph signalsJ Martin-Martinez, J Diaz, R Rodriguez, M Nafria, X AymerichIEEE Electron Device Letters 35 (4), 479-481, 2014752014
2-) A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCIMN Javier Diaz-Fortuny, Javier Martin-Martinez, Rosana Rodriguez, Rafael ...IEEE Journal of Solid-State Circuits, 1-13, 201841*2018
3-) Flexible setup for the measurement of CMOS time-dependent variability with array-based integrated circuitsJ Diaz-Fortuny, P Saraza-Canflanca, R Castro-Lopez, E Roca, ...IEEE Transactions on Instrumentation and Measurement 69 (3), 853-864, 2019292019
4-) Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltagesM Maestro, J Martin-Martinez, J Diaz, A Crespo-Yepes, MB Gonzalez, ...Microelectronic Engineering 147, 176-179, 2015292015
5-) New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAMM Maestro, J Diaz, A Crespo-Yepes, MB Gonzalez, J Martin-Martinez, ...Solid-State Electronics 115, 140-145, 2016272016