Jeffrey Jargon

Jeffrey Jargon

National Institute of Standards and Technology - Maryland / United States
Others
AD Scientific Index ID: 4397746
person_outline Jeffrey Jargon's MOST POPULAR ARTICLES
1-) Complex permittivity determination from propagation constant measurementsMD Janezic, JA JargonIEEE microwave and guided wave letters 9 (2), 76-78, 19993441999
2-) A statistical study of de-embedding applied to eye diagram analysisPD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ...IEEE Transactions on Instrumentation and Measurement 61 (2), 475-488, 20111462011
3-) Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substratesV Milanovic, M Ozgur, DC DeGroot, JA Jargon, M Gaitan, ME ZaghloulIEEE transactions on microwave theory and techniques 46 (5), 632-640, 19981461998
4-) Multiline TRL revealedDC DeGroot, JA Jargon, RB Marks60th ARFTG Conference Digest, Fall 2002., 131-155, 20021382002
5-) Applications of artificial neural networks in optical performance monitoringX Wu, JA Jargon, RA Skoog, L Paraschis, AE WillnerJournal of Lightwave Technology 27 (16), 3580-3589, 20091242009