Jeong-Min Lee

Jeong-Min Lee

Samsung Electronics, South Korea - Gyeonggi / South Korea
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4627677
삼성전자, 한국
person_outline Jeong-Min Lee's MOST POPULAR ARTICLES
1-) Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistorsJM Lee, IT Cho, JH Lee, HI KwonApplied Physics Letters 93 (9), 093504, 20085982008
2-) Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stressesIT Cho, JM Lee, JH Lee, HI KwonSemiconductor Science and Technology 24 (1), 015013, 20081322008
3-) Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with and gate dielectricsJM Lee, IT Cho, JH Lee, WS Cheong, CS Hwang, HI KwonApplied Physics Letters 94 (22), 222112, 20091112009
4-) Low-frequency noise in amorphous indium–gallium–zinc-oxide thin-film transistorsJM Lee, WS Cheong, CS Hwang, IT Cho, HI Kwon, JH LeeIEEE electron device letters 30 (5), 505-507, 2009802009
5-) Full-swing InGaZnO thin film transistor inverter with depletion loadJM Lee, IT Cho, JH Lee, HI KwonJapanese Journal of Applied Physics 48 (10R), 100202, 2009572009