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Jia Li
Institute of Microelectronics, Chinese Academy of Sciences - - / China
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AD Scientific Index ID: 4599538
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Jia Li's MOST POPULAR ARTICLES
1-)
iFill: An impact-oriented X-filling method for shift-and capture-power reduction in at-speed scan-based testingJ Li, Q Xu, Y Hu, X LiProceedings of the conference on Design, automation and test in Europe, 1184 …, 2008652008
2-)
On capture power-aware test data compression for scan-based testingJ Li, X Liu, Y Zhang, Y Hu, X Li, Q Xu2008 IEEE/ACM International Conference on Computer-Aided Design, 67-72, 2008442008
3-)
X-filling for simultaneous shift-and capture-power reduction in at-speed scan-based testingJ Li, Q Xu, Y Hu, X LiIEEE transactions on very large scale integration (VLSI) systems 18 (7 …, 2009342009
4-)
DfT optimization for pre-bond testing of 3D-SICs containing TSVsJ Li, D Xiang2010 IEEE International Conference on Computer Design, 474-479, 2010262010
5-)
On reducing both shift and capture power for scan-based testingJ Li, Q Xu, Y Hu, X Li2008 Asia and South Pacific Design Automation Conference, 653-658, 2008192008
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