Jibin Zou

Jibin Zou

Peking University - Beijing / China
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 719287
北京大学
person_outline Jibin Zou's MOST POPULAR ARTICLES
1-) Impacts of random telegraph noise (RTN) on digital circuitsM Luo, R Wang, S Guo, J Wang, J Zou, R HuangIEEE Transactions on Electron Devices 62 (6), 1725-1732, 2014652014
2-) Predictive 3-D modeling of parasitic gate capacitance in gate-all-around cylindrical silicon nanowire MOSFETsJ Zou, Q Xu, J Luo, R Wang, R Huang, Y WangIEEE transactions on electron devices 58 (10), 3379-3387, 2011632011
3-) Investigation on variability in metal-gate Si nanowire MOSFETs: Analysis of variation sources and experimental characterizationR Wang, J Zhuge, R Huang, T Yu, J Zou, DW Kim, D Park, Y WangIEEE transactions on electron devices 58 (8), 2317-2325, 2011582011
4-) New insights into AC RTN in scaled high-к/metal-gate MOSFETs under digital circuit operationsJ Zou, R Wang, N Gong, R Huang, X Xu, J Ou, C Liu, J Wang, J Liu, J Wu, ...2012 Symposium on VLSI Technology (VLSIT), 139-140, 2012432012
5-) New observations on complex RTN in scaled high-κ/metal-gate MOSFETs—The role of defect coupling under DC/AC conditionP Ren, P Hao, C Liu, R Wang, X Jiang, Y Qiu, R Huang, S Guo, M Luo, ...2013 IEEE International Electron Devices Meeting, 31.4. 1-31.4. 4, 2013342013