NEWS
Institutional Subscription: Comprehensive Analyses to Enhance Your Global and Local Impact
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 221 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
Login
Register & Pricing
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Jie Deng
IBM Corporation - New York / United States
Others
AD Scientific Index ID: 5340585
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Subject Leaders
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Jie Deng's MOST POPULAR ARTICLES
1-)
Robustness of RF MEMS capacitive switches with molybdenum membranesC Palego, J Deng, Z Peng, S Halder, JCM Hwang, DI Forehand, ...IEEE Transactions on Microwave Theory and Techniques 57 (12), 3262-3269, 2009672009
2-)
Temperature-dependent RF large-signal model of GaN-based MOSHFETsJ Deng, W Wang, S Halder, WR Curtice, JCM Hwang, V Adivarahan, ...IEEE transactions on microwave theory and techniques 56 (12), 2709-2716, 2008362008
3-)
Advanced modeling and optimization of high performance 32nm HKMG SOI CMOS for RF/analog SoC applicationsS Lee, J Johnson, B Greene, A Chou, K Zhao, M Chowdhury, J Sim, ...2012 Symposium on VLSI Technology (VLSIT), 135-136, 2012202012
4-)
Drain-to-gate field engineering for improved frequency response of GaN-based HEMTsN Pala, X Hu, J Deng, J Yang, R Gaska, Z Yang, A Koudymov, MS Shur, ...Solid-state electronics 52 (8), 1217-1220, 2008192008
5-)
Charge-pumping characterization of interface traps in Al2O3/In0. 75Ga0. 25As metal-oxide-semiconductor field-effect transistorsW Wang, J Deng, JCM Hwang, Y Xuan, Y Wu, PD YeApplied Physics Letters 96 (7), 2010152010
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept