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Joachim Schulz
European XFEL GmbH - Hamburg / Germany
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AD Scientific Index ID: 4432964
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Joachim Schulz's MOST POPULAR ARTICLES
1-)
Femtosecond X-ray protein nanocrystallographyHN Chapman, P Fromme, A Barty, TA White, RA Kirian, A Aquila, ...Nature 470 (7332), 73-77, 201123842011
2-)
Single mimivirus particles intercepted and imaged with an X-ray laserMM Seibert, T Ekeberg, FRNC Maia, M Svenda, J Andreasson, O Jönsson, ...Nature 470 (7332), 78-81, 201110572011
3-)
Multiple ionization of atom clusters by intense soft X-rays from a free-electron laserH Wabnitz, L Bittner, ARB De Castro, R Döhrmann, P Gürtler, T Laarmann, ...Nature 420 (6915), 482-485, 20025922002
4-)
Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurementsA Barty, C Caleman, A Aquila, N Timneanu, L Lomb, TA White, ...Nature photonics 6 (1), 35-40, 20124032012
5-)
Ultra-efficient ionization of heavy atoms by intense X-ray free-electron laser pulsesB Rudek, SK Son, L Foucar, SW Epp, B Erk, R Hartmann, M Adolph, ...Nature photonics 6 (12), 858-865, 20122922012
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