NEWS
Free Institutional Consultancy Services
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
John Wright
Columbia University New York - New York / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 911255
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Subject Leaders
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
John Wright's MOST POPULAR ARTICLES
1-)
Robust face recognition via sparse representationJ Wright, AY Yang, A Ganesh, SS Sastry, Y MaIEEE transactions on pattern analysis and machine intelligence 31 (2), 210-227, 2008113982008
2-)
Robust principal component analysis?EJ Candès, X Li, Y Ma, J WrightJournal of the ACM (JACM) 58 (3), 1-37, 201167062011
3-)
Image super-resolution via sparse representationJ Yang, J Wright, TS Huang, Y MaIEEE transactions on image processing 19 (11), 2861-2873, 201056192010
4-)
Sparse representation for computer vision and pattern recognitionJ Wright, Y Ma, J Mairal, G Sapiro, TS Huang, S YanProceedings of the IEEE 98 (6), 1031-1044, 201023252010
5-)
Robust principal component analysis: Exact recovery of corrupted low-rank matrices via convex optimizationJ Wright, A Ganesh, S Rao, Y Peng, Y MaAdvances in neural information processing systems 22, 200922302009
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept