Joonhyun Kim

Joonhyun Kim

Hanyang University - Seoul / South Korea
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4863214
한양대학교
person_outline Joonhyun Kim's MOST POPULAR ARTICLES
1-) Broadband thin-film transmission-line characterization for accurate high-frequency measurements of on-wafer componentsH Kim, J Kim, Y EoIEEE Transactions on Microwave Theory and Techniques 64 (3), 931-938, 2016132016
2-) IC package interconnect line characterization based on frequency-variant transmission line modeling and experimental S-parametersJ Kim, Y EoIEEE Transactions On Components, Packaging and Manufacturing Technology 9 (6 …, 201972019
3-) A New High-Frequency Characterization for Coupled Transmission Lines Fabricated on Lossy Organic SubstratesJ Kim, J Shin, D Lee, Y EoIEEE Transactions on Components, Packaging and Manufacturing Technology, 201912019
4-) New Wafer-Level High-Frequency Characterization of Coupled Transmission LinesD Lee, J Kim, Y EoIEEE Transactions on Microwave Theory and Techniques 67 (12), 4674-4681, 201912019
5-) Efficient eye-diagram determination technique of non-linearly-switching coupled-data links under power and ground fluctuation noisesJ Lee, J Kim, G Ji, H Kim, Y Eo2014 International SoC Design Conference (ISOCC), 122-123, 201412014