NEWS
Free Institutional Consultancy Services
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Jose Jimenez
Qorvo - Greensboro / United States
Others
AD Scientific Index ID: 4970053
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Jose Jimenez's MOST POPULAR ARTICLES
1-)
TEM observation of crack-and pit-shaped defects in electrically degraded GaN HEMTs U Chowdhury, JL Jimenez, C Lee, E Beam, P Saunier, T Balistreri, ... IEEE Electron Device Letters 29 (10), 1098-1100, 2008 1922008
2-)
Measurement of channel temperature in GaN high-electron mobility transistors J Joh, JA Del Alamo, U Chowdhury, TM Chou, HQ Tserng, JL Jimenez IEEE Transactions on Electron Devices 56 (12), 2895-2901, 2009 1682009
3-)
Self-consistent calculation of the electronic structure and electron-electron interaction in self-assembled InAs-GaAs quantum dot structures LRC Fonseca, JL Jimenez, JP Leburton, RM Martin Physical Review B 57 (7), 4017, 1998 1611998
4-)
Physical degradation of GaN HEMT devices under high drain bias reliability testingSY Park, C Floresca, U Chowdhury, JL Jimenez, C Lee, E Beam, ...Microelectronics Reliability 49 (5), 478-483, 20091332009
5-)
A simple current collapse measurement technique for GaN high-electron mobility transistorsJ Joh, JA Del Alamo, J JimenezIEEE Electron Device Letters 29 (7), 665-667, 2008932008
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept