Joy S Lee

Joy S Lee

University of Texas Dallas - Richardson / United States
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4847044
The University of Texas at Dallas
person_outline Joy S Lee's MOST POPULAR ARTICLES
1-) Large ferroelectric polarization of TiN/Hf0.5Zr0.5O2/TiN capacitors due to stress-induced crystallization at low thermal budgetSJ Kim, D Narayan, JG Lee, J Mohan, JS Lee, J Lee, HS Kim, YC Byun, ...Applied Physics Letters 111 (24), 242901, 20171942017
2-) Atomic layer deposition of silicon nitride thin films: a review of recent progress, challenges, and outlooksX Meng, YC Byun, HS Kim, JS Lee, AT Lucero, L Cheng, J KimMaterials 9 (12), 1007, 2016962016
3-) Low temperature (400° C) ferroelectric Hf0. 5Zr0. 5O2 capacitors for next-generation FRAM applicationsSJ Kim, D Narayan, JG Lee, J Mohan, JS Lee, J Lee, CD Young, J Kim, ...2017 IEEE International Memory Workshop (IMW), 1-4, 2017102017
4-) Inversion behavior of ALD HfZrO2/InGaAs MOS capacitors with in-situ DEZ-H2O treatmentJG Lee, YC Byun, D Narayan, AT Lucero, J Kim