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Julia Deitz
Sandia National Laboratories - New Mexico / United States
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AD Scientific Index ID: 4457912
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Julia Deitz's MOST POPULAR ARTICLES
1-)
Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imagingSD Carnevale, JI Deitz, JA Carlin, YN Picard, M De Graef, SA Ringel, ...Applied Physics Letters 104 (23), 232111, 2014682014
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Tunnel junction enhanced nanowire ultraviolet light emitting diodesATM Sarwar, BJ May, JI Deitz, TJ Grassman, DW McComb, RC MyersApplied Physics Letters 107 (10), 2015652015
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Applications of electron channeling contrast imaging for the rapid characterization of extended defects in III–V/Si heterostructuresSD Carnevale, JI Deitz, JA Carlin, YN Picard, DW McComb, M De Graef, ...IEEE Journal of Photovoltaics 5 (2), 676-682, 2014452014
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Thermal Conductivity of β-Phase Ga2O3 and (AlxGa1–x)2O3 Heteroepitaxial Thin FilmsY Song, P Ranga, Y Zhang, Z Feng, HL Huang, MD Santia, SC Badescu, ...ACS applied materials & interfaces 13 (32), 38477-38490, 2021372021
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Electron channeling contrast imaging for rapid III-V heteroepitaxial characterizationJI Deitz, SD Carnevale, SA Ringel, DW McComb, TJ GrassmanJournal of visualized experiments: JoVE, 2015272015
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