Jungyoon Hwang

SK Telecom - / South Korea

Others

AD Scientific Index ID: 4965761

SK 통신

Registration, Add Profile,
Premium Membership

Print Your Certificate

Jungyoon Hwang's MOST POPULAR ARTICLES

1-) Model-based clustering for integrated circuit yield enhancement JY Hwang, W Kuo European Journal of Operational Research 178 (1), 143-153, 2007 762007

2-) Yield prediction via spatial modeling of clustered defect counts across a wafer map SJ Bae, JY Hwang, W Kuo IIE Transactions 39 (12), 1073-1083, 2007 362007

3-) Modeling of integrated circuit yield using a spatial nonhomogeneous Poisson process JY Hwang, W Kuo, C Ha IEEE transactions on semiconductor manufacturing 24 (3), 377-384, 2011 122011

4-) Test map classification method and fabrication process condition setting method using the sameLEE Sunjae, J Hwang, J KimUS Patent 8,627,266, 201482014

5-) Spatial stochastic processes for yield and reliability management with applications to nano electronicsJY HwangTexas A&M University, 200482004

ARTICLES

Add your articles