Jungyoon Hwang

Jungyoon Hwang

SK Telecom - Seoul / South Korea
Others
AD Scientific Index ID: 4965761
SK 통신
person_outline Jungyoon Hwang's MOST POPULAR ARTICLES
1-) Model-based clustering for integrated circuit yield enhancement JY Hwang, W Kuo European Journal of Operational Research 178 (1), 143-153, 2007 762007
2-) Yield prediction via spatial modeling of clustered defect counts across a wafer map SJ Bae, JY Hwang, W Kuo IIE Transactions 39 (12), 1073-1083, 2007 362007
3-) Modeling of integrated circuit yield using a spatial nonhomogeneous Poisson process JY Hwang, W Kuo, C Ha IEEE transactions on semiconductor manufacturing 24 (3), 377-384, 2011 122011
4-) Parametric yield modeling using hidden variable logistic regressionJY Hwang, HC LeeJournal of Quality Technology 46 (4), 323-339, 201482014
5-) Test map classification method and fabrication process condition setting method using the sameLEE Sunjae, J Hwang, J KimUS Patent 8,627,266, 201482014