Kunhyuk Kang

Kunhyuk Kang

Qualcomm Ireland - Dublin / Ireland
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4385493
person_outline Kunhyuk Kang's MOST POPULAR ARTICLES
1-) Impact of NBTI on the temporal performance degradation of digital circuitsBC Paul, K Kang, H Kufluoglu, MA Alam, K RoyIEEE Electron Device Letters 26 (8), 560-562, 20053652005
2-) Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuitsBC Paul, K Kang, H Kufluoglu, MA Alam, K RoyProceedings of the Design Automation & Test in Europe Conference 1, 1-6, 20062062006
3-) Impact of negative-bias temperature instability in nanoscale SRAM array: Modeling and analysisK Kang, H Kufluoglu, K Roy, MA AlamIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 20071962007
4-) Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performanceK Kang, SP Park, K Roy, MA Alam2007 IEEE/ACM international conference on computer-aided design, 730-734, 20071222007
5-) NBTI induced performance degradation in logic and memory circuits: How effectively can we approach a reliability solution?K Kang, S Gangwal, SP Park, R Kaushik2008 Asia and South Pacific Design Automation Conference, 726-731, 20081182008